Thicknesses of Nanoscale Brine Films on Mineral Surfaces Under Geologic CO2 Sequestration Conditions Measured with Synchrotron X-ray Fluorescence

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ADS bibcode: 2012AGUFM.H23D1385K
year: 2012
Listed Authors: Kim, T.; Tokunaga, T. K.; Shuman, D. B.; Sutton, S. R.; Newville, M.; Lanzirotti, A.; Bargar, J.; Latimer, M.; Webb, S.
Listed Institutions: Earth Science Division, Lawrence Berkeley National Lab, Berkeley, CA, USA;; Earth Science Division, Lawrence Berkeley National Lab, Berkeley, CA, USA;; Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA;; Department of Geophysical Science, University of Chicago, Chicago, IL, USA;; Center for Advanced Radiation Sources, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA;; Center for Advanced Radiation Sources, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA;; Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Stanford, CA, USA;; Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Stanford, CA, USA;; Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Stanford, CA, USA;

Thicknesses of Nanoscale Brine Films on Mineral Surfaces Under Geologic CO2 Sequestration Conditions Measured with Synchrotron X-ray Fluorescence

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