Contact State Monitoring of Simulated Faults at Various Slip Rates by Electrical Conductivity Experiments

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ADS bibcode
2011AGUFM.T33F2487Y
year
2011
Listed Authors
Yamashita, F.
Fukuyama, E.
Mizoguchi, K.
Listed Institutions
NIED, Tsukuba, Japan;
NIED, Tsukuba, Japan;
CRIEPI, Abiko, Japan;

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