Modal analysis of rip current cell oscillations

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ADS bibcode: 2010AGUFMOS53D..04G
year: 2010
Listed Authors: Geiman, J.; Kirby, J. T.; Reniers, A. J.; Macmahan, J. H.
Listed Institutions: University of Delaware, Newark, DE, USA; University of Delaware, Newark, DE, USA; University of Miami, Miami, FL, USA; Naval Postgraduate School, Monterey, CA, USA

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