SIMS sensitivity factors of <SUP>2</SUP>H and <SUP>16</SUP>O<SUP>2</SUP>H relative to <SUP>18</SUP>O in spinel-structured oxides
- ADS bibcode
- 2020AGUFMDI0230008Z
- year
- 2020
- Listed Authors
- Zellmer, G. F.
- Sakamoto, N.
- Sakaguchi, I.
- Kuritani, T.
- Kuroda, M.
- Yurimoto, H.
- Listed Institutions
- Volcanic Risk Solutions, Massey University, Palmeston North, New Zealand
- Isotope Imaging Laboratory, Hokkaido University, Sapporo, Japan
- National Institute of Material Sciences, Tsukuba, Japan
- Osaka City University, Sumiyoshi-Ku, Osaka, Japan; Department of Earth and Planetary Sciences, Hokkaido University, Sapporo, Japan
- Geological Survey of Japan, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan
- Division of Earth and Planetary Sciences, Hokkaido University, Sapporo, Japan
Linked Authors [?]
Linked Institutions