Characterizing D-Region Roughness using LF/MF Signals of Opportunity

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ADS bibcode: 2019AGUFMSA51C3174H
year: 2019
Listed Authors: Higginson-Rollins, M. A.; Cohen, M.
Listed Institutions: Georgia Institute of Technology Main Campus, Atlanta, GA, United States; School of Electrical and Computer Engineering, Georgia Institute of Technology Main Campus, Atlanta, GA, United States

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Georgia Institute of Technology