EUV Diagnostics of Optically Thick Plasmas using the 304 Å channel

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ADS bibcode: 2018AGUFMSH33H3728K
year: 2018
Listed Authors: Kocher, M.; Landi, E.; Lepri, S. T.
Listed Institutions: Lockheed Martin Solar and Astrophysics Laboratory, Palo Alto, CA, United States; University of Michigan, Ann Arbor, MI, United States; Univ Michigan, Ann Arbor, MI, United States

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