Pitfalls in Trend Analysis: Sampling, Drifts, and Orthogonality

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ADS bibcode: 2017AGUFM.A21Q..04D
year: 2017
Listed Authors: Damadeo, R. P.; Zawodny, J. M.; Remsberg, E. E.; Walker, K. A.
Listed Institutions: NASA Langley Research Center, Hampton, VA, United States; NASA Langley Research Center, Hampton, VA, United States; NASA Langley, Yorktown, VA, United States; University of Toronto, Toronto, ON, Canada

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