Nanoscale Characterization of Fault Roughness by Atomic Force Microscopy

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    W[2015AGUFM.T54B..05T]
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    LI["Linked Institutions (2)"]
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ADS bibcode
2015AGUFM.T54B..05T
year
2015
Listed Authors
Thom, C.
Brodsky, E. E.
Goldsby, D. L.
Candela, T.
Carpick, R. W.
Listed Institutions
University of Pennsylvania, Philadelphia, PA, United States
University of California Santa Cruz, Santa Cruz, CA, United States
University of Pennsylvania, Philadelphia, PA, United States
University of California Santa Cruz, Santa Cruz, CA, United States
University of Pennsylvania, Philadelphia, PA, United States

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