Modeling Coniferous Canopy Structure over Extensive Areas for Ray Tracing Simulations: Scaling from the Leaf to the Stand Level

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ADS bibcode
2015AGUFM.B54D..06V
year
2015
Listed Authors
van Aardt, J. A.
van Leeuwen, M.
Kelbe, D.
Kampe, T.
Krause, K.
Listed Institutions
Rochester Institute of Technology, Rochester, NY, United States
Rochester Institute of Technology, Rochester, NY, United States
Oak Ridge National Laboratory, Oak Ridge, TN, United States
NEON, Boulder, CO, United States
NEON, Boulder, CO, United States

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