How thermal pressurization affects on dynamic fault branching

    flowchart
    W[2012AGUFM.S33A2520U]
    LA["Linked Authors (0)"]
    LI["Linked Institutions (2)"]
    W== author ==>LA
    W== affil ==>LI
    click LA "#linked-authors"
    click LI "#linked-institutions"

Graph neighborhood for 'How thermal pressurization affects on dynamic fault branching'. Click aggregate nodes to navigate.

ADS bibcode: 2012AGUFM.S33A2520U
year: 2012
Listed Authors: Urata, Y.; Hok, S.; Fukuyama, E.; Madariaga, R. I.
Listed Institutions: NIED, Tsukuba, Japan;; Laboratoire de Géologie, Ecole Normale Supérieure, Paris, France;; NIED, Tsukuba, Japan;; Laboratoire de Géologie, Ecole Normale Supérieure, Paris, France;

Linked Authors [?]

Linked Institutions