Brine Films Thickness on Silica Surfaces Under High Pressure Geologic CO2 Sequestration Conditions with Synchrotron X-ray Fluorescence

    flowchart
    W[2011AGUFM.V21A2475K]
    LA["Linked Authors (0)"]
    LI["Linked Institutions (2)"]
    W== author ==>LA
    W== affil ==>LI
    click LA "#linked-authors"
    click LI "#linked-institutions"
Graph neighborhood for 'Brine Films Thickness on Silica Surfaces Under High Pressure Geologic CO2 Sequestration Conditions with Synchrotron X-ray Fluorescence'. Click aggregate nodes to navigate.
ADS bibcode
2011AGUFM.V21A2475K
year
2011
Listed Authors
Kim, T.
Tokunaga, T. K.
Shuman, D.
Sutton, S. R.
Newville, M.
Lanzirotti, A.
Listed Institutions
Earth Science Division, Lawrence Berkeley National Lab, Berkeley, CA, USA;
Earth Science Division, Lawrence Berkeley National Lab, Berkeley, CA, USA;
Earth Science Division, Lawrence Berkeley National Lab, Berkeley, CA, USA;
Department of Geophysical Sciences and Center for Advanced Radiation Sources, University of Chicago, Chicago, IL, USA;
Department of Geophysical Sciences and Center for Advanced Radiation Sources, University of Chicago, Chicago, IL, USA;
Department of Geophysical Sciences and Center for Advanced Radiation Sources, University of Chicago, Chicago, IL, USA;

Linked Authors [?]

Linked Institutions