Improving Phyllosilicate Electron Backscatter Diffraction Data Using Ion Milling

    flowchart
    W[2010AGUFM.V51C2213W]
    LA["Linked Authors (0)"]
    LI["Linked Institutions (2)"]
    W== author ==>LA
    W== affil ==>LI
    click LA "#linked-authors"
    click LI "#linked-institutions"

Graph neighborhood for 'Improving Phyllosilicate Electron Backscatter Diffraction Data Using Ion Milling'. Click aggregate nodes to navigate.

ADS bibcode: 2010AGUFM.V51C2213W
year: 2010
Listed Authors: Ward, D. E.; Walck, S. D.; Mahan, K. H.; Geiss, R.
Listed Institutions: Geological Sciences, University of Colorado, Boulder, CO, USA; South Bay Technology, Inc., San Clemente, CA, USA; Geological Sciences, University of Colorado, Boulder, CO, USA; Nanomaterials Characterization Facility, University of Colorado, Boulder, CO, USA

Linked Authors [?]

Linked Institutions