The void Limit of Two-phase Damage; Applications to Shear Localization and Shear-Enhanced Compaction

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ADS bibcode
2002AGUFMNG22A..04R
year
2002
Listed Authors
Ricard, Y.
Bercovici, D.
Listed Institutions
ENS Lyon / CNRS, 46 allee d'Italie, Lyon, 69364 France
Yale University, P.O. BOX 208109, New Haven, CT 056520 United States

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