High-resolution fault imaging along DAS cable using spurious arrivals in noise interferometry

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    W[2021AGUFM.S35B0216Y]
    LA["Linked Authors (2)"]
    LI["Linked Institutions (1)"]
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ADS bibcode
2021AGUFM.S35B0216Y
year
2021
Listed Authors
Yang, Yan
Shen, Zhichao
Zhan, Zhongwen
Listed Institutions
California Institute of Technology, Pasadena, United States
California Institute of Technology, Pasadena, United States
California Institute of Technology, Pasadena, United States

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