Multi-objective Wavelength Selection for Snap-bean Yield Assessment Using Remote Sensing: A Field Study
- ADS bibcode
- 2020AGUFMB004.0006H
- year
- 2020
- Listed Authors
- Hassanzadeh, A.
- van Aardt, J. A.
- Zhang, F.
- Murphy, S. P.
- Pethybridge, S. J.
- Listed Institutions
- Imaging Science, Rochester Institute of Technology, Rochester, NY, United States
- Imaging Science, Rochester Institute of Technology, Rochester, NY, United States
- Imaging Science, Rochester Institute of Technology, Rochester, United States
- Plant Pathology & Plant-Microbe Biology Section, Cornell University, Ithaca, United States
- Plant Pathology & Plant-Microbe Biology Section, Cornell University, Ithaca, United States
Linked Authors [?]
Linked Institutions