Yield Modelling and Harvest Scheduling of Snap-bean Using Remote Sensing: A Greenhouse Study

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ADS bibcode
2019AGUFM.B31K2416H
year
2019
Listed Authors
Hassanzadeh, A.
van Aardt, J. A.
Pethybridge, S. J.
Murphy, S. P.
Listed Institutions
Imaging Science, Rochester Institute of Technology, Rochester, NY, United States
Imaging Science, Rochester Institute of Technology, Rochester, NY, United States
Plant Pathology & Plant-Microbe Biology Section, Cornell University, Ithaca, United States
Plant Pathology & Plant-Microbe Biology Section, Cornell University, Ithaca, United States

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