Advanced light element and low energy X-ray line analysis using Energy Dispersive Spectrometry (EDS) with Silicon Drift Detectors (SDD)
- ADS bibcode
- 2013AGUFM.V53B2796S
- year
- 2013
- Listed Authors
- Salge, T.
- Palasse, L.
- Berlin, J.
- Hansen, B.
- Terborg, R.
- Falke, M.
- Listed Institutions
- Bruker Nano GmbH, Berlin, Germany;
- Bruker Nano GmbH, Berlin, Germany;
- Bruker Nano GmbH, Berlin, Germany;
- Bruker Nano GmbH, Berlin, Germany;
- Bruker Nano GmbH, Berlin, Germany;
- Bruker Nano GmbH, Berlin, Germany;
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Linked Institutions