An Atom Trap Trace Analysis Device to Measure Kr in Xe at the Parts-Per-Trillion Level

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ADS bibcode
2013AGUFM.H13I1483L
year
2013
Listed Authors
Loose, A.
Yoon, T.
Goetzke, L.
Aprile, E.
Zelevinsky, T.
Listed Institutions
Department of Physics, Columbia University, New York, NY, USA;
Department of Physics, Columbia University, New York, NY, USA;
Department of Physics, Columbia University, New York, NY, USA;
Department of Physics, Columbia University, New York, NY, USA;
Department of Physics, Columbia University, New York, NY, USA;

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