Evidence of low temperature fractionation of silicon in Archean cherts: SIMS Si and O isotope measurements of 3.42-3.26 Ga banded carbonaceous cherts from the Onverwacht Group, Barberton Greenstone Belt, South Africa

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ADS bibcode
2012AGUFM.V54B..08S
year
2012
Listed Authors
Stefurak, E. J.
Fischer, W. W.
Lowe, D. R.
Listed Institutions
Geological and Environmental Sciences, Stanford University, Stanford, CA, USA;
Geological and Planetary Sciences, California Institute of Technology, Pasadena, CA, USA;
Geological and Environmental Sciences, Stanford University, Stanford, CA, USA;

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