The Relationship Between Atomic and Oxide Ion Formation From Sputtered Particles During SIMS and The Chemistry of The Substrate Material. (Invited)

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ADS bibcode
2010AGUFM.V51C2218F
year
2010
Listed Authors
Fahey, A. J.
Zeissler, C.
Newbury, D.
Davis, J.
Lindstrom, R.
Listed Institutions
NIST, Gaithersburg, MD, USA
NIST, Gaithersburg, MD, USA
NIST, Gaithersburg, MD, USA
NIST, Gaithersburg, MD, USA
NIST, Gaithersburg, MD, USA

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