Diffraction Effects in Remote-Sensing Instruments and SI Traceability

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ADS bibcode: 2008AGUFMGC23A0762S
year: 2008
Listed Authors: Shirley, E. L.; Dionne, C. E.
Listed Institutions: NIST, 100 Bureau Dr., MS 8441, Gaithersburg, MD 20899-8441, USA; BAE Systems, 65 Spit Brook Rd. MS NCA01-0132, Nashua, NH 03060, USA

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