Electrical resistivity tomography

    flowchart
    AA["Associated Authors (27)"]
    C[Electrical resistivity tomography]
    BC["Broader Concepts (1)"]
    NC["Narrower Concepts (0)"]
    C== skos:broader ==>BC
    NC== skos:broader ==>C
    AA== dcterms:relation ==>C
    click BC "#broader-concepts"
    click NC "#narrower-concepts"
    click AA "#associated-authors"

    NI["add incoming edge"]
    NO["add outgoing edge"]
    NI-- ? -->C
    C-- ? -->NO
    click NI "#add-incoming-edge"
    click NO "#add-outgoing-edge"
    style NI stroke-width:2px,stroke-dasharray: 5 5
    style NO stroke-width:2px,stroke-dasharray: 5 5

Wikidata

https://www.wikidata.org/wiki/Q488986

OpenAlex ID

https://openalex.org/C60591178 (API record)

OpenAlex Description

geophysical technique for imaging sub-surface structures

OpenAlex Level [?]

3

Broader Concepts

• Electrical resistivity and conductivity

Narrower Concepts

Associated Authors

• Adrián Flores-Orozco
• Andreas Kemna
• Azamat Zakirov
• Bokani Nthaba
• C. R. Murphy
• D. A. Ciraula
• Ding-Jiun Lin
• Giorgio Cassiani
• Ilyas Yanbukhtin
• J. Robinson
• Jacopo Boaga
• James Boyd
• Jonas K. Limbrock
• Jonathan Chambers
• M. Cimpoiasu
• Mauricio Arboleda‐Zapata
• Michael Eyob Kiflai
• P.K. Maurya
• Ping-Yu Chang
• Prarabdh Tiwari
• Rakesh Salunke
• Rita Deiana
• Robin Thibaut
• Ronny Figueroa
• S. J. Breen
• S. Uhlemann
• Thomas Hermans

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