X-ray photoelectron spectroscopy

    flowchart
    AA["Associated Authors (3)"]
    C[X-ray photoelectron spectroscopy]
    BC["Broader Concepts (2)"]
    NC["Narrower Concepts (6)"]
    C== skos:broader ==>BC
    NC== skos:broader ==>C
    AA== dcterms:relation ==>C
    click BC "#broader-concepts"
    click NC "#narrower-concepts"
    click AA "#associated-authors"

    NI["add incoming edge"]
    NO["add outgoing edge"]
    NI-- ? -->C
    C-- ? -->NO
    click NI "#add-incoming-edge"
    click NO "#add-outgoing-edge"
    style NI stroke-width:2px,stroke-dasharray: 5 5
    style NO stroke-width:2px,stroke-dasharray: 5 5

Wikidata

https://www.wikidata.org/wiki/Q899559

OpenAlex ID

https://openalex.org/C175708663 (API record)

OpenAlex Description

a surface-sensitive quantitative spectroscopic technique that measures the elemental composition at the parts per thousand range, empirical formula, chemical state and electronic state of the elements that exist within a material.

OpenAlex Level [?]

2

Broader Concepts

• Chemical engineering
• Nuclear magnetic resonance

Narrower Concepts

• Chemical state
• Electron spectroscopy
• Low-energy ion scattering
• Photoemission spectroscopy
• Temperature-programmed reduction
• Ultraviolet photoelectron spectroscopy

Associated Authors

• Eric L. Bullock
• K.C. Wong
• Étienne Plésiat

Add Incoming Edge

Login via ORCiD to contribute.

Add Outgoing Edge

Login via ORCiD to contribute.